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Statistical Process Control: SPC Advanced Techniques Outline

Review
X (X bar) and R charts
Cp and Cpk indices

Chart Interpretation
Zone analysis
Patterns

Design of Experiments
Test of significance
ANOVA
Designed experiments
Taguchi techniques

Regression and Correlation
Coefficients of correlation
Curve fitting
Sign test

Measurement Systems Analysis
Short and long methods

   
   

G.R. Technologies
115 Franklin Ave.
Thornhill, Ontario
L4J 4X6

E-mail: info@grt77.com
Tel: (905) 597-9277
Fax: (905) 597-5761

 

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